On the Current Behavior of Faulty and Fault-Free ICs and the Impact on Diagnosis

FPGA Design for Decimeter Scale Integration (DMSI) p. 64 Process Variations and their Impact on Circuit Operation p. 73 Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits p. 84 Characterization of CMOS Defects Using Transient Signal Analysis p. 93 Accurate Fault Modeling and Fault Simulation of Resistive Bridges p. 102 Functional Verification Coverage vs. Physical Stuck-at Fault Coverage p. 108 An Integrated HW and SW Fault Injection Environment for Real-Time Systems p. 117 Increasing Current Testing Resolution p. 126 On-Chip Test Embedding for Multi-Weighted Random LFSRs p. 135 A New Method for Testing EEPLA's p. 146 C-Testable One-Dimensional ILAs with Respect to Path Delay Faults: Theory and Applications p. 155